Description
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Reserved 2024-09-02 | Published 2025-02-03 | Updated 2025-02-03 | Assigner
qualcommHIGH: 7.8CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Problem types
CWE-823 Use of Out-of-range Pointer Offset
Product status
Default status
unaffected
FastConnect 6700
affected
FastConnect 6900
affected
FastConnect 7800
affected
QCM5430
affected
QCM6490
affected
QCS5430
affected
QCS6490
affected
Qualcomm Video Collaboration VC3 Platform
affected
SC8380XP
affected
SDM429W
affected
Snapdragon 429 Mobile Platform
affected
Snapdragon 7c+ Gen 3 Compute
affected
Snapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB)
affected
WCD9370
affected
WCD9375
affected
WCD9380
affected
WCD9385
affected
WCN3620
affected
WCN3660B
affected
WSA8830
affected
WSA8835
affected
WSA8840
affected
WSA8845
affected
WSA8845H
affected
References
docs.qualcomm.com/...itybulletin/february-2025-bulletin.html
cve.org (CVE-2024-45573)
nvd.nist.gov (CVE-2024-45573)
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